Dr. Kasem Khalil
at Western Kentucky Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2022 Poster + Paper
Proceedings Volume PC12053, PC120530Y (2022) https://doi.org/10.1117/12.2622550
KEYWORDS: Defect detection, Scanning electron microscopy, Defect inspection, Performance modeling, Data modeling, Bridges, Semiconducting wafers, Stochastic processes, Molecular bridges, Sensors

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