Katsuya Abe
at KIOXIA Corp.
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 June 2022 Presentation
Kazuya Fukuhara, Masaki Mitsuyasu, Ryo Ogawa, Katsuya Abe, Anupam Mitra, Sachiko Kobayashi, Satoshi Mitsugi, Motofumi Komori, Takuya Kono
Proceedings Volume PC12054, PC120540B (2022) https://doi.org/10.1117/12.2614407
KEYWORDS: Optical alignment, Semiconducting wafers, Nanoimprint lithography, Lithography, Semiconductor manufacturing, Semiconductors, Overlay metrology, Optical simulations, Manufacturing, Wafer-level optics

Proceedings Article | 26 May 2022 Presentation + Paper
Proceedings Volume 12052, 1205208 (2022) https://doi.org/10.1117/12.2614319
KEYWORDS: Nanoimprint lithography, Semiconducting wafers, Optical alignment, Optical lithography, Scanning electron microscopy, Ultraviolet radiation, Lithography, Scanning transmission electron microscopy

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top