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Kentaro Kasa
at KIOXIA Corp.
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Publications (1)
Proceedings Article | 10 April 2024 Presentation + Paper
Advanced overlay metrology for wafer bonding applications
Tomohiro Goto, Yoshimitsu Kato, Takashi Koike, Kentaro Kasa, Yusuke Tanaka, Akihiro Nakae
Proceedings Volume 12955, 129550T (2024) https://doi.org/10.1117/12.3010317
KEYWORDS: Wafer bonding, Overlay metrology, Semiconducting wafers, Silicon, Advanced process control, Feedback loops, Design, Wafer testing, Metrology, Semiconductors
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