Dr. Kiho Yang
at imec
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume PC12953, PC129530Z (2024) https://doi.org/10.1117/12.3011854
KEYWORDS: Critical dimension metrology, Extreme ultraviolet lithography, Optical lithography, Line width roughness, Photoresist materials, Semiconducting wafers, Finite element methods, Printing, Inspection, Cadmium

Proceedings Article | 10 April 2024 Presentation + Paper
Ryoung-Han Kim, Apoorva Oak, Yasser Sherazi, Gioele Mirabelli, Soobin Hwang, Kiho Yang, Hsinlan Chang
Proceedings Volume 12954, 1295405 (2024) https://doi.org/10.1117/12.3009888
KEYWORDS: Design, Metals, Optical proximity correction, Semiconductors, Optical lithography, Photomasks, Logic, Standards development, Manufacturing, Transistors

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