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Zachary E. Kranefeld
at Tufts University
SPIE Involvement:
Author
Area of Expertise:
micro-optics , physics , semiconductors , design engineering , sensors , imaging
Profile Summary
My career experience with imaging technology has brought me great personal satisfaction. As a member of the DSOC team, I was fortunate enough to watch the camera I helped develop leave Earth and set records amongst the long list of NASA and MIT technologies in space. I hope to continue my blossoming career of innovating technology for space-based scientific missions.
Publications (6)
Proceedings Article | 10 June 2024 Presentation
Active area measurement of 1064nm InGaAsP/InP Geiger mode avalanche photodiodes
Caroline Tally, Abigail Licht, Zachary Kranefeld, Jonathan Richardson, Denis Nothern, K. Alexander McIntosh, Erik Duerr
Proceedings Volume PC13025, PC1302501 (2024) https://doi.org/10.1117/12.3016840
KEYWORDS: Avalanche photodiodes, Avalanche photodetectors, Telecommunications, TCAD, Radiation effects, Quantum systems, Quantum particles, Quantum optics experiments, Quantum optical communication, Quantum experiments
Proceedings Article | 13 March 2024 Presentation
Iridium processing of metasurfaces for infrared optical applications
Proceedings Volume PC12888, PC128880N (2024) https://doi.org/10.1117/12.3001949
KEYWORDS: Iridium, Infrared radiation, Reactive ion etching, Optics manufacturing, Scanning electron microscopy, Vacuum chambers, Thin films, Thin film deposition, Sputter deposition, Spectroscopic ellipsometry
Proceedings Article | 11 March 2024 Presentation + Paper
Microscope design for direct optical characterization of various microlens technologies
Zachary Kranefeld, Emily Carlson, Denis Nothern, Abigail Licht, Thomas Vandervelde
Proceedings Volume 12893, 128930F (2024) https://doi.org/10.1117/12.3002955
KEYWORDS: Microscopes, Design, Microlens, Cameras, Sensors, Avalanche photodetectors, Microlens array, Image processing
Proceedings Article | 11 March 2024 Poster + Paper
Determination of PMMA etch rates using VASE modeling
Proceedings Volume 12880, 128800T (2024) https://doi.org/10.1117/12.3002035
KEYWORDS: Etching, Polymethylmethacrylate, Argon, Data modeling, Silicon, Film thickness, Statistical modeling, Polarized light, Refractive index, Reflection
Proceedings Article | 30 May 2022 Presentation + Paper
A direct-detection LIDAR detector for the Europa lander concept
Meera Punjiya, Kevin Ryu, Brian Aull, K. Alexander McIntosh, Kevan Donlon, Mike Brattain, Hermanus Pretorius, Denis Nothern, Noah Pestana, Thomas Karolyshyn, Jorgo Mihallari, Zachary Kranefeld, Erik Duerr, Anup Katake, Alejandro Miguel San Martin
Proceedings Volume 12089, 1208903 (2022) https://doi.org/10.1117/12.2618800
KEYWORDS: Sensors, Silicon, Readout integrated circuits, LIDAR, Microlens array, Avalanche photodetectors, Silica, Aluminum nitride, Tolerancing, Reticles
Showing 5 of 6 publications
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