Dr. Lilian del Risco Norrlid
at KTH Royal Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 March 2009 Paper
Lilián del Risco Norrlid, Erik Fredenberg, Magnus Hemmendorff, Christian Jackowski, Mats Danielsson
Proceedings Volume 7258, 72581O (2009) https://doi.org/10.1117/12.813677
KEYWORDS: Sensors, Prototyping, Photon counting, Computed tomography, Modulation transfer functions, Signal to noise ratio, Polymethylmethacrylate, X-ray computed tomography, Diagnostics, Visualization

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