Luis Alves
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 July 2011 Paper
Hugo Gonçalves, Peter Schellenberg, Michael Belsley, Luís Alves, Cacilda Moura, Tobias Stauber
Proceedings Volume 8001, 80014G (2011) https://doi.org/10.1117/12.892147
KEYWORDS: Graphene, Dielectrics, Refractive index, Reflection, Polymethylmethacrylate, Silicon, Visibility, Visualization, Silica, Semiconducting wafers

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top