Mahirah Zaini
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 October 2022 Presentation + Paper
Proceedings Volume 12239, 122390K (2022) https://doi.org/10.1117/12.2633249
KEYWORDS: Machine learning, Scanning electron microscopy, Optical microscopes, Diffraction, Optical microscopy, Tin, Super resolution, Neural networks, Near field scanning optical microscopy

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