Unspecified Marat Shakirov Profile

Marat Shakirov

at Institute of Physics and Technology of the RAS

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 31 January 2022 Paper

Measurement of polarization quantum states under chromatic aberration conditions

Yu. Bogdanov, B. Bantysh, N. Bogdanova, M. Shakirov, V. Lukichev

Proceedings Volume 12157, 121572B (2022) https://doi.org/10.1117/12.2624247

KEYWORDS: Polarization, Wave plates, Chromatic aberrations, Fuzzy logic, Quantum communications, Tomography, Quantum information, Standards development, Signal attenuation, Quantum optics

Read Abstract +

The wave plate is a basic device for transforming and measuring the polarization states of light. It is known that the transformation of light by means of two wave plates makes it possible to measure the state of polarization in an arbitrary basis. The finite spectral width of the light, however, leads to a chromatic aberration of the polarization quantum transformation caused by the parasitic dispersion of the birefringence of the plate material. This causes systematic errors in the tomography of quantum polarization states and significantly reduces its accuracy. This study is a development of our work¹, in which an adequate model for quantum measurements of polarization qubits under chromatic aberration was first formulated. This work includes a generalization of the results obtained earlier for the cases of two-qubit states. Along with examples of random states those uniformly distributed over the Haar measure are considered. Using a matrix of complete information, it is quantitatively traced how the presence of chromatic aberrations under conditions of a finite spectral width of light leads to the loss of information in quantum measurements. It is shown that the use of the developed model of fuzzy measurements instead of the model of standard projection measurements makes it possible to suppress systematic errors of quantum tomography even when using high-order wave plates. It turns out that the fuzzy measurement model can give a significant increase in the reconstruction accuracy compared to the standard measurement model.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years