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Mark Malburg
at Digital Metrology Solutions Inc
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 4 October 2023 Presentation + Paper
Why you should pay attention to international standards in optical metrology
Proceedings Volume 12672, 1267203 (2023) https://doi.org/10.1117/12.2675503
KEYWORDS: Standards development, Equipment, Calibration, Tunable filters, Metrology, Optical surfaces, Optical metrology, Measurement uncertainty, Time metrology, Manufacturing
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