CONFERENCE PROCEEDINGS
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Dr. Maxim Shatalov
at Sensor Electronic Technology Inc
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Author
Publications (4)
Proceedings Article | 15 September 2016 Presentation + Paper
Scanning near-field optical microscopy of AlGaN epitaxial layers
Proceedings Volume 9926, 992605 (2016) https://doi.org/10.1117/12.2236999
KEYWORDS: Near field scanning optical microscopy, Light emitting diodes, Optical microscopy, Luminescence, Aluminum, Spatial resolution, Near field scanning optical microscopy, Light emitting diodes, Near field, Aluminum nitride, Gallium, Spectroscopy
Proceedings Article | 13 March 2015 Paper
High-efficiency UV LEDs on sapphire
Max Shatalov, Rakesh Jain, Alex Dobrinsky, Wenhong Sun, Yuri Bilenko, Jinwei Yang, Michael Shur, Remis Gaska
Proceedings Volume 9363, 93631M (2015) https://doi.org/10.1117/12.2079874
KEYWORDS: Light emitting diodes, Deep ultraviolet, External quantum efficiency, Ultraviolet radiation, Sapphire, Ultraviolet light emitting diodes, Reflectivity, Quantum efficiency, Aluminum nitride, Quantum wells
Proceedings Article | 17 September 2009 Paper
Deep ultraviolet semiconductor light sources for sensing and security
Max Shatalov, Yuri Bilenko, Jinwei Yang, Remis Gaska
Proceedings Volume 7484, 74840C (2009) https://doi.org/10.1117/12.840193
KEYWORDS: Light emitting diodes, Deep ultraviolet, Luminescence, Lamps, Ultraviolet radiation, Modulation, Quantum wells, Sensors, Semiconductors
Proceedings Article | 22 February 2006 Paper
Reliability of AlGaN-based deep UV LEDs on sapphire
Maxim Shatalov, Zheng Gong, Mikhail Gaevski, Shuai Wu, Wenhong Sun, Vinod Adivarahan, M. Asif Khan
Proceedings Volume 6134, 61340P (2006) https://doi.org/10.1117/12.647204
KEYWORDS: Light emitting diodes, Deep ultraviolet, Reliability, Sapphire, Gallium, Aluminum, Stereolithography, Metals, Aluminum nitride, Cladding
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