KEYWORDS: Nanomanipulation, Nanorobotics, Particles, Atomic force microscopy, Nanoparticles, Control systems, Polymers, Systems modeling, Sensors, Nanowires
This paper surveys the history of tip based micro/nanomanipulation systems and the contributions of the authors in
this topic. Atomic force microscope or scanning tunnerling microscope type of microscopes has been used as
nanorobotic manipulation systems since 1990. Using single or multiple tips, many mechanical, electrical, and
chemical micro/nanomanipulation applications have demonstrated. The authors contributed to teleoperated and
automated control of such systems and also developed new tip based micro/nanomanipulation methods to draw
polymer micro/nanofibers and create nanowires on substrates precisely and repeatedly.
Conference Committee Involvement (7)
Independent Component Analyses, Compressive Sampling, Large Data Analyses (LDA), Neural Networks, Biosystems, and Nanoengineering XIII
23 April 2015 | Baltimore, MD, United States
Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering XII
7 May 2014 | Baltimore, MD, United States
Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering XI
1 May 2013 | Baltimore, Maryland, United States
Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering X
25 April 2012 | Baltimore, Maryland, United States
Optomechatronic Micro/Nano Devices and Components II
4 October 2006 | Boston, Massachusetts, United States
Optomechatronic Micro/Nano Devices and Components
5 December 2005 | Sapporo, Japan
Optomechatronic Micro/Nano Components, Devices, and Systems
27 October 2004 | Philadelphia, Pennsylvania, United States
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