Michel Vuillermet
Deputy Technical Director at Lynred
SPIE Involvement:
Author
Publications (25)

Proceedings Article | 30 July 2014 Paper
S. Guieu, P. Feautrier, G. Zins, J.-B. Le Bouquin, E. Stadler, P. Kern, J. Rothman, M. Tauvy, J. Coussement, E. de Borniol, J-L. Gach, M. Jacquard, T. Moulin, S. Rochat, A. Delboulb, S. Derelle, C. Robert, M. Vuillermet, A. Mérand, P. Bourget
Proceedings Volume 9146, 91461N (2014) https://doi.org/10.1117/12.2056334
KEYWORDS: Sensors, Cameras, Interferometry, Stars, Telescopes, Infrared cameras, Avalanche photodetectors, Near infrared, Interferometers, Polarization

Proceedings Article | 24 October 2012 Paper
Proceedings Volume 8541, 854109 (2012) https://doi.org/10.1117/12.977470
KEYWORDS: Sensors, Staring arrays, Avalanche photodetectors, Diodes, Photodiodes, Infrared detectors, Epitaxy, Temperature metrology, Infrared technology, Manufacturing

Proceedings Article | 13 September 2012 Paper
Philippe Feautrier, Jean-Luc Gach, Mark Downing, Paul Jorden, Johann Kolb, Johan Rothman, Thierry Fusco, Philippe Balard, Eric Stadler, Christian Guillaume, David Boutolleau, Gérard Destefanis, Nicolas Lhermet, Olivier Pacaud, Michel Vuillermet, Alexandre Kerlain, Norbert Hubin, Javier Reyes, Markus Kasper, Olaf Ivert, Wolfgang Suske, Andrew Walker, Michael Skegg, Sophie Derelle, Joel Deschamps, Clélia Robert, Nicolas Vedrenne, Frédéric Chazalet, Julien Tanchon, Thierry Trollier, Alain Ravex, Gérard Zins, Pierre Kern, Thibaut Moulin, Olivier Preis
Proceedings Volume 8447, 84470Q (2012) https://doi.org/10.1117/12.925067
KEYWORDS: Sensors, Cameras, Adaptive optics, Charge-coupled devices, Wavefront sensors, Imaging systems, Avalanche photodetectors, CMOS sensors, Infrared radiation, Quantum efficiency

Proceedings Article | 31 May 2012 Paper
Proceedings Volume 8353, 83532K (2012) https://doi.org/10.1117/12.921868
KEYWORDS: Sensors, Staring arrays, Avalanche photodetectors, Diodes, Epitaxy, Photodiodes, Infrared detectors, Liquid phase epitaxy, Temperature metrology, Manufacturing

Proceedings Article | 21 May 2011 Paper
Michel Vuillermet, Laurent Rubaldo, Fabien Chabuel, Christophe Pautet, Jean Christophe Terme, Laurent Mollard, Johan Rothman, Nicolas Baier
Proceedings Volume 8012, 80122W (2011) https://doi.org/10.1117/12.885601
KEYWORDS: Sensors, Diodes, Medium wave, Staring arrays, Infrared detectors, Interference (communication), Reliability, Temperature metrology, Mercury cadmium telluride, CMOS technology

Showing 5 of 25 publications
Conference Committee Involvement (6)
Infrared Technology and Applications XLIII
9 April 2017 | Anaheim, CA, United States
Infrared Technology and Applications XLII
18 April 2016 | Baltimore, MD, United States
Infrared Technology and Applications XLI
20 April 2015 | Baltimore, MD, United States
Infrared Technology and Applications XL
5 May 2014 | Baltimore, MD, United States
Infrared Technology and Applications XXXIX
29 April 2013 | Baltimore, Maryland, United States
Showing 5 of 6 Conference Committees
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