Dr. Mor Baram
at Applied Materials Israel Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12955, 1295516 (2024) https://doi.org/10.1117/12.3010898
KEYWORDS: Optical proximity correction, Metrology, Modeling, Extreme ultraviolet, Scanning electron microscopy, Shrinkage, Contour extraction, Signal to noise ratio, EUV optics

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12955, 1295519 (2024) https://doi.org/10.1117/12.3010756
KEYWORDS: Data modeling, Metrology, Process control, Scanning electron microscopy, Deep learning, Neural networks, Mathematical optimization, Machine learning, Critical dimension metrology

Proceedings Article | 30 April 2023 Presentation
Proceedings Volume 12496, 1249616 (2023) https://doi.org/10.1117/12.2658249
KEYWORDS: Extreme ultraviolet, Stochastic processes, Scanners, Finite element methods

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