Mr. Peng Liu Profile

Peng Liu

at ShanghaiTech Univ.

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 9 January 2023 Paper

The design of a near backscattering detection device for surface morphology of spherically bent crystal analyzer

Xuanqi Zeng, Kaiyu Zhang, Xing Liu, Peng Liu, Tsu-chien Weng

Proceedings Volume 12507, 1250721 (2023) https://doi.org/10.1117/12.2656267

KEYWORDS: Crystals, X-rays, Backscatter, Sensors, X-ray detectors, Light sources, Spectrometers, Inspection, X-ray technology, X-ray sources

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Proceedings Article | 9 January 2023 Paper

Design of ultrafast laser plasma x-ray source in laboratory

Dawei Zhang, Xing Liu, Kaiyu Zhang, Ruixue Zhu, Peng Liu, Tsu-Chien Weng, Runze Li

Proceedings Volume 12507, 125070Y (2023) https://doi.org/10.1117/12.2655204

KEYWORDS: X-rays, X-ray sources, Copper, Plasma, Pulsed laser operation, Sensors, Ultrafast phenomena, Ultrafast laser spectroscopy, X-ray diffraction, Spectroscopy

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Proceedings Article | 27 March 2022 Paper

X-ray focal properties of spherically bent crystals for synchrotron and XFEL spectroscopy

Kaiyu Zhang, Xing Liu, Peng Liu, Xiaowei Yang, Tsu-Chien Weng

Proceedings Volume 12169, 121697H (2022) https://doi.org/10.1117/12.2625018

KEYWORDS: X-rays, Crystals, Spectroscopy, Spectrometers, Sensors, Backscatter, X-ray technology, Ray tracing, X-ray sources, Synchrotrons

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Proceedings Article | 27 March 2022 Paper

Single-pulse spectrometer for hard x-ray free electron lasers

Liu Xing, Kaiyu Zhang, Peng Liu, Shengzhen Yi, Tsu-Chien Weng

Proceedings Volume 12169, 1216982 (2022) https://doi.org/10.1117/12.2625095

KEYWORDS: Spectroscopy, X-rays, Crystals, Free electron lasers, X-ray diffraction, Sensors, Hard x-rays, Diffraction, X-ray lasers, Optical design

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Proceedings Article | 15 February 2022 Paper

Fabrication of bent crystal analyzer for high energy-resolution x-ray spectroscopy

Xing Liu, Dawei Zhang, Xuanqi Zeng, Kaiyu Zhang, Peng Liu, Tsu-Chien Weng

Proceedings Volume 12166, 1216674 (2022) https://doi.org/10.1117/12.2617924

KEYWORDS: Crystals, Spherical lenses, X-rays, Semiconducting wafers, Spectroscopy, Silicon, X-ray fluorescence spectroscopy, Analytical research, X-ray diffraction, Fabrication

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