Dr. Peter Maksymovych
Distinguished Scientist at Oak Ridge National Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 October 2023 Presentation
Proceedings Volume PC12651, PC1265105 (2023) https://doi.org/10.1117/12.2677437
KEYWORDS: Switching, Scanning probe microscopy, Polarization, Data modeling, Statistical analysis, Spatial resolution, Polarization imaging, Oxides, Molecular bridges, Microelectronics

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