Mr. Pieter J. M. Kerstens Profile

Pieter J. M. Kerstens

at KLA Corp

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 1 August 1992 Paper

CCD photoresponse calibration and contrast adjustment for reliable material discrimination in the inspection of electronic packages

Ralph Ford, Pieter Kerstens, Alan Dorundo

Proceedings Volume 1661, (1992) https://doi.org/10.1117/12.130303

KEYWORDS: Analog electronics, Amplifiers, Charge-coupled devices, Calibration, Error analysis, Inspection, Quantization, Digital signal processing, CCD cameras, Optical amplifiers

Read Abstract +

Proceedings Article | 1 March 1992 Paper

Fast confocal image processing for inspection

A. Ravishankar Rao, Frederick Wu, Jon Mandeville, Pieter Kerstens

Proceedings Volume 1708, (1992) https://doi.org/10.1117/12.58562

KEYWORDS: Confocal microscopy, Deconvolution, Inspection, Image processing, Evolutionary algorithms, Signal detection, Electronic filtering, Signal processing, Microscopes, Machine vision

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years