Porui Tian
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 November 2019 Paper
Yifan Li, Porui Tian, Dongsheng Li
Proceedings Volume 11343, 113431O (2019) https://doi.org/10.1117/12.2548772
KEYWORDS: Liquids, Interfaces, Atomic force microscopy, Surface roughness, Particles, Microfluidics, Nanoparticles, Thin films, Silica

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