Pouria Zangi
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 14 October 2022 Presentation + Paper
Atsushi Momose, Ryosuke Ueda, Mingjian Cai, Zhuoxuan Zhao, Sam Kalirai, Maderych Stan, Jeff Irwin, Hiroki Kawakami, Pouria Zangi, Pascal Meyer, Martin Börner, Joachim Schulz
Proceedings Volume 12242, 1224210 (2022) https://doi.org/10.1117/12.2636393
KEYWORDS: X-rays, X-ray imaging, Interferometers, Sensors, Microscopes, Phase imaging, Super resolution, X-ray detectors, Spatial resolution, Image sensors

SPIE Journal Paper | 25 May 2022 Open Access
Michael Richter, Thomas Beckenbach, Heiner Daerr, Sven Prevrhal, Martin Börner, Josephine Gutekunst, Pouria Zangi, Arndt Last, Jan Korvink, Pascal Meyer
JM3, Vol. 21, Issue 02, 024901, (May 2022) https://doi.org/10.1117/12.10.1117/1.JMM.21.2.024901
KEYWORDS: X-rays, Interfaces, Semiconducting wafers, X-ray lithography, X-ray imaging, X-ray detectors, Metals, Manufacturing, X-ray sources, Silicon

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