Prof. Qingqing Sun
at Fudan Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 February 2012 Paper
Xin-Yan Liu, Xi Lin, Cheng-Wei Cao, Qing-Qing Sun, Paul-Chang Lin, Yi-Jun Bian, Cheng Xing, Peng-Fei Wang, David Wei Zhang
Proceedings Volume 8255, 82551S (2012) https://doi.org/10.1117/12.907186
KEYWORDS: CMOS sensors, Image sensors, Electrodes, Transistors, Device simulation, Photodiodes, Scanning electron microscopy, Charge-coupled devices, Nondestructive evaluation, Photography

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