Dr. Ronald E. Scotti
Science and Technology Strategist
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 24 April 2003 Paper
Flavio Pardo, Vladimir Aksyuk, Susanne Arney, H. Bair, Nagesh Basavanhally, David Bishop, Gregory Bogart, Cristian Bolle, J. Bower, Dustin Carr, H. Chan, Raymond Cirelli, E. Ferry, Robert Frahm, Arman Gasparyan, John Gates, C. Randy Giles, L. Gomez, Suresh Goyal, Dennis Greywall, Martin Haueis, R. Keller, Jungsang Kim, Fred Klemens, Paul Kolodner, Avi Kornblit, T. Kroupenkine, Warren Lai, Victor Lifton, Jian Liu, Yee Low, William Mansfield, Dan Marom, John Miner, David Neilson, Mark Paczkowski, C. Pai, A. Ramirez, David Ramsey, S. Rogers, Roland Ryf, Ronald Scotti, Herbert Shea, M. Simon, H. Soh, Hong Tang, J. Taylor, K. Teffeau, Joseph Vuillemin, J. Weld
Proceedings Volume 5116, (2003) https://doi.org/10.1117/12.499075
KEYWORDS: Mirrors, Electrodes, Silicon, Microelectromechanical systems, Switches, Reflectors, Semiconducting wafers, Microopto electromechanical systems, Oxides, Optical fabrication equipment

Proceedings Article | 5 April 2001 Paper
Yee Low, Ronald Scotti, David Ramsey, Cristian Bolle, Steven O'Neill, Khanh Nguyen
Proceedings Volume 4408, (2001) https://doi.org/10.1117/12.425359
KEYWORDS: Ceramics, Packaging, Microopto electromechanical systems, Thin films, Metals, Electronics, Microelectromechanical systems, Reliability, Connectors, Dielectrics

Proceedings Article | 5 April 2001 Paper
Ronald Scotti, Nagesh Basavanhally, Yee Low, David Ramsey, David Bishop
Proceedings Volume 4408, (2001) https://doi.org/10.1117/12.425362
KEYWORDS: Packaging, Microelectromechanical systems, Microopto electromechanical systems, Mirrors, Optical networks, Interfaces, Optical amplifiers, Free space optics, Chemical elements, Channel projecting optics

Proceedings Article | 15 January 1996 Paper
John Gates, G. Henein, Joseph Shmulovich, Dirk Muehlner, W. Michael MacDonald, Ronald Scotti
Proceedings Volume 2610, (1996) https://doi.org/10.1117/12.230076
KEYWORDS: Silicon, Fiber lasers, Semiconductor lasers, Semiconducting wafers, Laser bonding, Laser packaging, Laser welding, Photodetectors, Laser applications, Temperature metrology

Conference Committee Involvement (2)
SPIE DSS
5 May 2014 | Baltimore, United States
SPIE Defense, Security, and Sensing
29 April 2013 | Baltimore, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top