Dr. Samuel T. Osofsky
Senior Analyst at Metron Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 January 2002 Paper
Proceedings Volume 4488, (2002) https://doi.org/10.1117/12.452819
KEYWORDS: Charge-coupled devices, Image processing, Imaging systems, LIDAR, Receivers, Photons, Sensors, Convolution, Signal to noise ratio, Transmitters

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