Coherent or partially coherent X-rays have recently been utilized in beamlines at advanced synchrotron radiation facilities and X-ray free-electron lasers. Wave-optical and ray-tracing calculations are widely employed to predict intensity and phase distributions of X-ray beams when designing new beamlines. Both calculation methods have
their respective advantages and disadvantages. In this presentation, we will compare the results of calculations in optical systems that use X-ray focusing mirrors, and introduce a method for combining these two methods. Furthermore, we will discuss the applications of this method for calculating partially coherent X-rays.
KEYWORDS: X-rays, Mirrors, Signal detection, Optical properties, Signal intensity, Nonlinear optics, X-ray lasers, Signal generators, Free electron lasers
We have developed a two-stage soft X-ray focusing system at BL1 of SACLA. The system consists of two free-form mirrors, a ring focusing mirror and a quasi ellipsoidal mirror. Soft X-rays with photon energies around 120 eV can be focused down to φ350 nm. By using its unique intensity pattern after focusing, we propose a background-free signal detection method for extremely low optical signals such as SHG of soft X-ray.
This paper presents the designs and simulations of twin Wolter mirrors for focusing and imaging experiments with soft Xray free electron lasers. Wave-optical simulations at a photon energy of 100 eV indicate that the designed focusing Wolter mirror focuses soft X-ray beams to a 300 nm × 200 nm spot with an acceptable rotational error of 1.7 mrad × 1.4 mrad and that the objective Wolter mirror, which receives the beam that passes through the focusing Wolter mirror and a sample, forms bright-field images with a spatial resolution of 140 nm × 140 nm. The focusing Wolter mirror enables long-term experiments with high stability, and the objective Wolter mirror is applicable to imaging-before-destruction.
An X-ray ellipsoidal mirror requires nanometer-level shape accuracy for its internal surface. Owing to the difficulty in processing the surface, electroforming using a high precision master mandrel has been applied to mirror fabrication. In order to investigate the replication accuracy of electroforming, a measurement method for the entire internal surface of the mirror must be developed. The purpose of this study is to evaluate the shape replication accuracy of electroforming. In this study, a three-dimensional shape measurement apparatus for an X-ray ellipsoidal mirror is developed. The apparatus is composed of laser probes, a contact probe, reference flats, a z-axis stage, and a rotation table. First, longitudinal profiles of a mandrel or mirror placed vertically on the rotation table are measured at several angular positions. Subsequently, without realignment of the measured sample, circularity at every height is measured at regular intervals of 0.1 mm. During each measurement, the effect of motion errors is calculated and subtracted from each profile by referring to the distances between the probes and reference flats. Combining the circularity data with the longitudinal profiles, a three-dimensional error distribution of the entire surface is obtained. Using a mandrel with nanometer-level shape accuracy and a replicated mirror, the performance of the measurement apparatus and the replication accuracy are evaluated. Measurement repeatability of single-nanometer order and replication accuracy of sub-100-nm order are confirmed.
The Wolter mirror is a promising imaging device for soft x-ray microscopy owing to its excellent characteristics. Its annular aperture enables high-NA design while maintaining high photon transfer efficiency. However, its deep and narrow cylinder-like shape makes its fabrication difficult. Despite its long history, the Wolter mirror has not been practically used for high-resolution microscopy. We have been developing a fabrication process for grazing incidence mirrors with rotationally symmetric shapes. The mirrors are replicated from precisely machined mandrels. We employ electroforming as a replication method with high replication accuracy and reproductivity. Here, we report the first fabrication of a Wolter mirror and discuss the replication quality in electroforming. The imaging quality of Wolter mirror is also evaluated in an observation experiment using a visible-light microscope.
Mirrors are key devices for creating various systems in optics. Focusing X-ray and extreme ultraviolet (EUV) light requires mirror surfaces with an extremely high accuracy. The figure of an ellipsoidal mirror is obtained by rotating an elliptical profile, and using such a mirror, soft X-ray and EUV light can be focused to dimensions on the order of nanometers without chromatic aberration. Although the theoretical performance of ellipsoidal mirrors is extremely high, the fabrication of an ideal ellipsoidal mirror remains problematic. Based on this background, we have been working to develop a fabrication system for ellipsoidal mirrors. In this proceeding, we briefly introduce the fabrication process and the soft X-ray focusing performance of the ellipsoidal mirror fabricated using the proposed process.
The Wolter mirror has been a promising imaging device in X-ray microscopy owing to its excellent characteristics such
as no achromatic aberration, a large aperture and a long work distance. Despite its long history, a Wolter mirror has not
been practically used for high resolution microscopy because extremely high figure accuracy is required on the surface.
In this paper, we will show the result of optical simulations targeted at the design of a soft X-ray imaging system with
sub-10nm spatial resolution.
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