Dr. Seyoon Kim
at SAMSUNG Advanced Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 October 2023 Presentation + Paper
Proceedings Volume 12687, 1268709 (2023) https://doi.org/10.1117/12.2674111
KEYWORDS: Long wavelength infrared, Deep learning, Image restoration, Image sensors, Image quality, Modulation transfer functions, Modulation, Image sharpness, Imaging systems, Optical metamaterials

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