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Dr. Stanislav Pechev
at ICMCB
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 17 May 2018 Presentation + Paper
Large (GeTe):(Sb2Te3) ratio phase change memory thin films
M. Bouska, S. Pechev, Q. Simon, V. Nazabal, J. Gutwirth, P. Nemec
Proceedings Volume 10683, 106830A (2018) https://doi.org/10.1117/12.2306503
KEYWORDS: Tellurium, Antimony, Germanium, Thin films, Crystals, Ferroelectric materials, Data modeling, Refractive index, Scanning electron microscopy, Reflectivity
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