Dr. Takehiro Tachizaki
at Tokai University
SPIE Involvement:
Author
Area of Expertise:
scanning probe microscopy , ultrafast spectroscopy , terahertz , interferometry , Ramans spectroscopy , plasmonics
Profile Summary

Takehiro Tachizaki (TT) received his B.E., M.E., and D.E. degrees from Hokkaido University, Sapporo, Japan, in 2002, 2004, and 2007, respectively. TT worked at Hitachi, Ltd. from 2007 to 2012 and was engaged in the research and development of industrial measurement technology. TT's research interests include high-resolution and high-precision measurement of material surfaces by scanning probe microscopy, optical interferometry, and time-resolved spectroscopy. TT likes designing and conducting measurements using his own designed equipment. TT won the R&D100 Awards twice in 2011 and 2014.
Publications (1)

Proceedings Article | 4 October 2022 Presentation
Proceedings Volume PC12203, PC1220304 (2022) https://doi.org/10.1117/12.2633344
KEYWORDS: Waveguides, Thin films, Spectroscopy, Near field optics, Tolerancing, Raman spectroscopy, Molecular spectroscopy, Diamond, Transducers, Thin film devices

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