Teng-da Zhang
at Hefei University of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 January 2016 Paper
Proceedings Volume 9903, 990308 (2016) https://doi.org/10.1117/12.2217642
KEYWORDS: Defect inspection, Inspection, Fourier transforms, Defect detection, LCDs, Cameras, Image resolution, Binary data, Fiber optic illuminators, Flat panel displays

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