Thinh On
at New Mexico Institute of Mining and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 April 2022 Presentation + Paper
Proceedings Volume 12046, 120460J (2022) https://doi.org/10.1117/12.2612359
KEYWORDS: Corner detection, Detection and tracking algorithms, Structural health monitoring, Image processing, Feature extraction, Facial recognition systems, Machine vision, Machine learning, Damage detection, Computing systems

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