KEYWORDS: Ray tracing, Sensors, Projection systems, X-rays, Computer simulations, Monte Carlo methods, X-ray imaging, Signal attenuation, Refraction, 3D modeling
X-ray based inspection often relies on triangular meshes, for example to inspect objects that were manufactured from CAD models. In this work, we present three complementary implementations of X-ray mesh projectors, obtained by adapting state-of-the-art rendering techniques to the simulation of X-ray imaging. The first technique is rasterization, where the interaction of each triangle with the X-ray beam is simulated in parallel using the NVIDIA CUDA toolkit. The second approach is ray tracing, where the interaction of each ray with the mesh is simulated in parallel using the NVIDIA OptiX framework. Both recursive and non-recursive versions of ray tracing are described. The simulated XCT setup is described in terms of a cone beam projection geometry that is compatible with the corresponding geometry in the ASTRA toolbox. All three projectors were benchmarked on a series of tests with varying resolution of both the mesh and the detector. The rasterizer exhibited the best computation time in most benchmark scenarios, coupled with the best scalability w.r.t. both the mesh size and the detector size. However, the recursive ray tracing approach offers more capabilities towards implementing additional optical effects such as refraction.
In this work, we propose an extension of the recently presented Parametric Reconstruction (PARE) algorithm1 towards the direct reconstruction of straight and curved fibers in glass fiber-refinforced polymer (GFRP) samples. The fibers are traced based on the Fiber Assignment by Continuous Tracking by introducing a piece-wise linear model. We show how the algorithm can estimate fiber parameters from the X-ray projection data and give an outlook on its application in our existing fiber estimation framework.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.