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Tino Uhlig
at Technische Univ Chemnitz
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Publications (1)
Proceedings Article | 16 February 2020 Presentation + Paper
Critical discussion of the determination of internal losses in state-of-the-art (Al,In)GaN laser diodes
Proceedings Volume 11280, 112800Y (2020) https://doi.org/10.1117/12.2546169
KEYWORDS: Semiconductor lasers, Waveguides, Error analysis, Mirrors, Laser damage threshold, Optical spectroscopy, Spectroscopes, Optical simulations, Waveguide lasers, Diodes
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