Toshiya Umeda
Executive Manager/Development at Adhand Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 14 November 2007 Paper
T. Umeda, H. Kawashima, T. Miho, K. Moriya
Proceedings Volume 6730, 67304Q (2007) https://doi.org/10.1117/12.746358
KEYWORDS: Air contamination, Polymethylmethacrylate, Neodymium, Photomasks, Polymers, Carbon, Ions, Chemical analysis, Particle filters, Composites

Proceedings Article | 28 June 2005 Paper
Proceedings Volume 5853, (2005) https://doi.org/10.1117/12.617128
KEYWORDS: Reticles, Particles, Photomasks, Contamination, Inspection, Scanners, Glasses, Air contamination, Polymers, Adhesives

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