Dr. Veit Wagner
at Jacobs Univ Bremen
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 September 2005 Paper
H. Gomes, P. Stallinga, M. Murgia, F. Biscarini, T. Muck, V. Wagner, E. Smits, D. de Leeuw
Proceedings Volume 5940, 59400K (2005) https://doi.org/10.1117/12.617862
KEYWORDS: Transistors, Capacitors, Semiconductors, Organic semiconductors, Dielectrics, Capacitance, Temperature metrology, Field effect transistors, Thin films, Resistance

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