Virpi Korpelainen
at MIKES Mittatekniikan keskus
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | 28 February 2012
Virpi Korpelainen, Jeremias Seppä, Antti Lassila
JM3, Vol. 11, Issue 1, 011002, (February 2012) https://doi.org/10.1117/12.10.1117/1.JMM.11.1.011002
KEYWORDS: Calibration, Error analysis, Metrology, Atomic force microscopy, Interferometers, Atomic force microscope, Interferometry, Time metrology, Standards development, Statistical analysis

Proceedings Article | 1 June 2011 Paper
Proceedings Volume 8036, 80360Q (2011) https://doi.org/10.1117/12.883818
KEYWORDS: Calibration, Error analysis, Atomic force microscopy, Metrology, Interferometers, Interferometry, Time metrology, Standards development, Refractive index, Scanners

SPIE Journal Paper | 1 October 2004
OE, Vol. 43, Issue 10, (October 2004) https://doi.org/10.1117/12.10.1117/1.1787834
KEYWORDS: Temperature metrology, Refractive index, Acoustics, Humidity, Ultrasonography, Distance measurement, Interferometry, Interferometers, Protactinium, Sensors

Proceedings Article | 20 November 2003 Paper
Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.504468
KEYWORDS: Refractive index, Temperature metrology, Acoustics, Humidity, Ultrasonography, Transducers, Distance measurement, Interferometry, Interferometers, Time metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top