Wade A. Berzett
at Georgia Institution of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 August 2005 Paper
A. Zaghloul, W. Berzett, D. Keeling
Proceedings Volume 5870, 58700N (2005) https://doi.org/10.1117/12.619707
KEYWORDS: Polarizers, Thin films, Refractive index, Tolerancing, Polarization, Signal attenuation, Thin film coatings, Computing systems, Thin film devices, Interfaces

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top