Wallace P. Printz
Process Engineer at Tokyo Electron America Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 19 March 2012 Paper
Proceedings Volume 8325, 83250K (2012) https://doi.org/10.1117/12.916310
KEYWORDS: Extreme ultraviolet, Extreme ultraviolet lithography, Finite element methods, Capillaries, Polymers, Line width roughness, Neodymium, Polymer thin films, Protactinium, Semiconducting wafers

Proceedings Article | 1 April 2009 Paper
Proceedings Volume 7273, 72731H (2009) https://doi.org/10.1117/12.816581
KEYWORDS: Diffusion, Double patterning technology, Photoresist processing, Lithography, Fiber optic illuminators, Chemistry, Image processing, Calibration, Critical dimension metrology, Printing

Proceedings Article | 16 March 2009 Paper
Proceedings Volume 7274, 72740I (2009) https://doi.org/10.1117/12.814289
KEYWORDS: Image processing, Photoresist processing, Double patterning technology, Photomasks, Optical lithography, Printing, Scanning electron microscopy, Scanners, Manufacturing, Lithography

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top