Dr. Wanchuck Woo
at Oak Ridge National Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 April 2009 Paper
Wanchuck Woo, Charles Chin, Zhili Feng, Hsin Wang, Wei Zhang, Hanbing Xu, Philip Sklad
Proceedings Volume 7299, 729912 (2009) https://doi.org/10.1117/12.818368
KEYWORDS: Inspection, Thermography, Radiation thermography, Infrared imaging, Resistance, Temperature metrology, Nondestructive evaluation, Thermal modeling, Infrared cameras, Finite element methods

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