Weishi Zheng
at Sun Yat-sen University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 December 2022 Presentation
Proceedings Volume 12318, 1231802 (2022) https://doi.org/10.1117/12.2642511
KEYWORDS: Silicon, Silicon films, Thin films, Refractive index, Polarization control, Photonics, Optical properties, Optical imaging, Nanostructures, Mid-IR

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