Prof. Xianyu Su
Director of 3-D Sensing and Machine Vision Lab at Sichuan Univ
SPIE Involvement:
Author
Publications (89)

SPIE Journal Paper | 18 June 2021
Yanli Hou, Xianyu Su, Wenjing Chen
OE, Vol. 60, Issue 06, 064105, (June 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.6.064105
KEYWORDS: Cameras, Imaging systems, Calibration, Panoramic photography, Optical engineering, Systems modeling, Photogrammetry, Image resolution, Computing systems, Virtual reality

Proceedings Article | 4 December 2017 Paper
Proceedings Volume 1230, 12307H (2017) https://doi.org/10.1117/12.2294906

SPIE Journal Paper | 26 October 2017
OE, Vol. 56, Issue 10, 104109, (October 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.10.104109
KEYWORDS: Distortion, Imaging systems, Calibration, Cameras, Projection systems, Optical engineering, Computer simulations, Associative arrays, Fringe analysis, Phase measurement

Proceedings Article | 24 October 2017 Paper
Yong-Liang Xiao, Jianxin Zhong, Qican Zhang, Xianyu Su, Zhisheng You
Proceedings Volume 10458, 104580P (2017) https://doi.org/10.1117/12.2283439
KEYWORDS: Photogrammetry, Calibration, Reflection, Mirrors, Metrology, Fringe analysis, Deflectometry

SPIE Journal Paper | 10 October 2017
Pei Zhou, Jiangping Zhu, Xianyu Su, Hailong Jing, Xing Zhang
OE, Vol. 56, Issue 10, 104102, (October 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.10.104102
KEYWORDS: Computer programming, Binary data, 3D metrology, Cameras, 3D image processing, Projection systems, Calibration, Reconstruction algorithms, 3D image reconstruction, 3D acquisition

Showing 5 of 89 publications
Conference Committee Involvement (6)
Dimensional Optical Metrology and Inspection for Practical Applications IV
20 April 2015 | Baltimore, MD, United States
Dimensional Optical Metrology and Inspection for Practical Applications III
5 May 2014 | Baltimore, MD, United States
Dimensional Optical Metrology and Inspection for Practical Applications II
25 August 2013 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications
22 August 2011 | San Diego, California, United States
Interferometry XII: Applications
4 August 2004 | Denver, Colorado, United States
Showing 5 of 6 Conference Committees
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