Dr. Ximing Ren
at Heriot-Watt Univ
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | 27 December 2017 Open Access
Rachael Tobin, Abderrahim Halimi, Aongus McCarthy, Ximing Ren, Kenneth McEwan, Stephen McLaughlin, Gerald Buller
OE, Vol. 57, Issue 03, 031303, (December 2017) https://doi.org/10.1117/12.10.1117/1.OE.57.3.031303
KEYWORDS: Target detection, Camouflage, Detection and tracking algorithms, Sensors, Reconstruction algorithms, Profiling, Data acquisition, Transceivers, Single photon detectors, LIDAR

Proceedings Article | 13 May 2015 Paper
Aurora Maccarone, Aongus McCarthy, Ximing Ren, Ryan Warburton, Andy Wallace, James Moffat, Yvan Petillot, Gerald Buller
Proceedings Volume 9492, 94920I (2015) https://doi.org/10.1117/12.2176959
KEYWORDS: Signal attenuation, Imaging systems, Scattering, Transmittance, Sensors, Ocean optics, Transceivers, Target detection, Underwater imaging, Target acquisition

Proceedings Article | 6 May 2015 Paper
Proceedings Volume 9504, 95040J (2015) https://doi.org/10.1117/12.2178950
KEYWORDS: Microlens, Microlens array, Sensors, Silicon, Photodetectors, Quenching (fluorescence), Imaging systems, CMOS technology, CMOS sensors, Avalanche photodiodes

Proceedings Article | 10 October 2012 Paper
Gerald Buller, Aongus McCarthy, Ximing Ren, Nathan Gemmell, Robert Collins, Nils Krichel, Michael Tanner, Andrew Wallace, Sandor Dorenbos, Val Zwiller, Robert Hadfield
Proceedings Volume 8460, 84601I (2012) https://doi.org/10.1117/12.965890
KEYWORDS: Imaging systems, Single photon, Signal to noise ratio, Sensors, Profiling, Picosecond phenomena, Single photon detectors, Avalanche photodiodes, LIDAR, Nanowires

Proceedings Article | 16 September 2011 Paper
Gerald Buller, Nils Krichel, Aongus McCarthy, Nathan Gemmell, Michael Tanner, Chandra Natarajan, Ximing Ren, Robert Hadfield
Proceedings Volume 8155, 81551I (2011) https://doi.org/10.1117/12.899377
KEYWORDS: Single photon detectors, Sensors, Data acquisition, Imaging systems, LIDAR, Semiconductor lasers, Radar, Range imaging, Picosecond phenomena, Silicon

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