Terahertz (THz) time-domain spectroscopy (TDS) is attracting more and more attention recently, and has been growing up as a powerful technique for measuring the material parameters. Indium phosphide (InP), which with short carrier average collision time, high band-gap energy and low effective mass, is growing up as one of the best photoconductive materials for emitting and detecting THz waves. An n-type InP of 0.35 Ω•cm was measured with normal transmitted TDS system for the temperature and frequency ranges of 4.2 - 300 K and 0.2 - 4 THz, respectively. THz beam was placed in a closed box purged with dry nitrogen gas, and the sample was mounted in a MicrostatHe cryostat made by Oxford Instruments. Temperature dependence of THz properties for InP as a function of frequency was characterized.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.