Dr. Yan-Ying He
at Taiwan Semiconductor Manufacturing Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 31 March 2014 Paper
Proceedings Volume 9052, 90520Y (2014) https://doi.org/10.1117/12.2045538
KEYWORDS: 3D modeling, Scanning electron microscopy, Diffusion, Data modeling, Lithography, Calibration, Semiconducting wafers, Visual process modeling, 3D image processing, Optical proximity correction

Proceedings Article | 10 April 2013 Paper
C. S. Chou, Y. Y. He, Y. P. Tang, Y. T. Chang, W. C. Huang, R. G. Liu, T. S. Gau
Proceedings Volume 8681, 868113 (2013) https://doi.org/10.1117/12.2010846
KEYWORDS: 3D modeling, Scanning electron microscopy, Photoresist materials, Diffusion, Calibration, Critical dimension metrology, Performance modeling, 3D image processing, Optical proximity correction, Lithography

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