Yasuhiro Yoshitake
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12955, 129551B (2024) https://doi.org/10.1117/12.3010113
KEYWORDS: X-rays, Microscopes, Metals, X-ray imaging, Reflection, Mirrors, Multilayers, Transmittance, Silicon, Nondestructive evaluation

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