Yongsheng Luo
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 June 2023 Paper
Proceedings Volume 12715, 1271519 (2023) https://doi.org/10.1117/12.2682390
KEYWORDS: Temperature metrology, Clouds, Inspection, Temperature control, Inspection equipment, Control systems, Calibration, Signal detection, Facial recognition systems, Equipment

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