Ms. Yujie Zhao Profile

Yujie Zhao

at Xi'an Institute of Applied Optics

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 24 July 2018 Paper

Precision adjustment and scanning control method of interferometric imaging spectrometer with a variable gap

Hemin Meng, Jiaobo Gao, Nan Wang, Chunhui Pan, Jianghui Wu, Yujie Zhao, Fang Liu

Proceedings Volume 10827, 1082709 (2018) https://doi.org/10.1117/12.2500536

KEYWORDS: Spectroscopy, Interferometers, Prisms, Sensors, Interferometry, Imaging systems, Infrared imaging, Target detection, Signal to noise ratio, Infrared spectroscopy

Read Abstract +

Proceedings Article | 28 February 2017 Paper

A compact LWIR imaging spectrometer with a variable gap Fabry-Perot interferometer

Fang Zhang, Jiaobo Gao, Nan Wang, Yujie Zhao, Lei Zhang, Shan Gao

Proceedings Volume 10256, 102562W (2017) https://doi.org/10.1117/12.2257646

KEYWORDS: Fourier transforms, Fabry–Perot interferometry, Long wavelength infrared, Spectroscopy, Interferometers, Reflectivity, Infrared imaging, Infrared radiation, Fringe analysis, Imaging systems

Read Abstract +

Proceedings Article | 25 October 2016 Paper

A compact LWIR Fourier transform imaging spectrometer employing a variable gap Fabry-Perot interferometer

Fang Zhang, Jiaobo Gao, Fang Liu, Yujie Zhao, Yawei Zheng, Lei Zhang

Proceedings Volume 10156, 101560W (2016) https://doi.org/10.1117/12.2246591

KEYWORDS: Long wavelength infrared, Fabry–Perot interferometry, Fourier transforms, Spectroscopy, Infrared imaging, Infrared radiation, Imaging spectroscopy, Imaging systems

Read Abstract +

Proceedings Article | 30 August 2013 Paper

Research on methods of spectral calibration and radiometric calibration of the windowing Fourier transform imaging spectrometer

Lei Zhang, Jiao Bo Gao, Yu Jie Zhao, Yan Ling Luo, Xiang Guo Xiao, Fang Zhang

Proceedings Volume 8910, 891011 (2013) https://doi.org/10.1117/12.2033092

KEYWORDS: Calibration, Spectroscopy, Spectral calibration, Fourier transforms, Light sources, Integrating spheres, Data processing, Charge-coupled devices, Optical testing, Atmospheric corrections

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years