Paper
18 July 2000 X-ray pn-CCDs on the XMM Newton Observatory
Lothar Strueder, Norbert Meidinger, Elmar Pfeffermann, Robert Hartmann, Heinrich W. Braeuninger, Claus Reppin, Ulrich G. Briel, Horst Hippmann, W. Kink, D. Hauff, Norbert Krause, Bernd Aschenbach, Gisela D. Hartner, Konrad Dennerl, Frank Haberl, Diana Stoetter, S. Kemmer, Joachim E. Truemper, Gerhard Lutz, Rainer H. Richter, P. Solc, Rouven Eckhardt, Eckhard Kendziorra, Markus Kuster, Christoph von Zanthier, Peter Holl, A. Viehl, S. Krisch, Josef Kemmer, Heike Soltau
Author Affiliations +
Abstract
XMM-Newton, the most powerful X-ray telescope ever built was launched from the european space port Kourou on december 10 last year. Three large X-ray Wolter type mirror systems are focusing the incoming X-rays from 100 eV up to 15,000 eV onto the focal instruments: fully depleted backside illuminated pn-CCDs and frontside illuminated MOS-CCDs. The concept of the pn-CCD camera will be briefly described and its performance on ground and in orbit will be shown. Special emphasis will be given to the radiation hardening of the devices, to the instrument background and to the experience of charged particle background in space. A comparison of the performance on ground and after 5 months in space will be shown.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lothar Strueder, Norbert Meidinger, Elmar Pfeffermann, Robert Hartmann, Heinrich W. Braeuninger, Claus Reppin, Ulrich G. Briel, Horst Hippmann, W. Kink, D. Hauff, Norbert Krause, Bernd Aschenbach, Gisela D. Hartner, Konrad Dennerl, Frank Haberl, Diana Stoetter, S. Kemmer, Joachim E. Truemper, Gerhard Lutz, Rainer H. Richter, P. Solc, Rouven Eckhardt, Eckhard Kendziorra, Markus Kuster, Christoph von Zanthier, Peter Holl, A. Viehl, S. Krisch, Josef Kemmer, and Heike Soltau "X-ray pn-CCDs on the XMM Newton Observatory", Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); https://doi.org/10.1117/12.391614
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Cited by 9 scholarly publications.
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KEYWORDS
Particles

X-rays

Electrons

Cameras

Sensors

Calibration

Silicon

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