Presentation
7 March 2022 DEEP learning powered De-scattering with Excitation Patterning (DEEP) for high-throughput wide-field multiphoton microscopy
Author Affiliations +
Abstract
Multiphoton microscopy is the gold standard for deep tissue fluorescence imaging. Long wavelengths enable hundreds of microns deep penetration of excitation light, but the emission fluorescence at shorter wavelengths encounters scattering before detection. While not being an issue for point scanning geometries, for wide-field geometries emission light scattering degrades the image quality. In this work, we use temporally focused pattered excitations to spatially encode image information before emission light scattering. Upon detection, images are reconstructed computationally by solving a linear inverse problem. We further improve our results by learning inverse solvers and optimal patterns through physics-based deep learning.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Navodini Wijethilake, Cheng Zheng, Jong K. Park, Murat Yildirim, Udith Haputhanthri, Peter T. C. So, and Dushan N. Wadduwage "DEEP learning powered De-scattering with Excitation Patterning (DEEP) for high-throughput wide-field multiphoton microscopy", Proc. SPIE PC11965, Multiphoton Microscopy in the Biomedical Sciences XXII, PC119650B (7 March 2022); https://doi.org/10.1117/12.2615331
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KEYWORDS
Multiphoton microscopy

Optical lithography

Light scattering

Data modeling

Mathematical modeling

Image quality

Luminescence

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