Dr. Chenggen Quan Profile

Dr. Chenggen Quan

Associate Professor at National Univ of Singapore

SPIE Involvement:

Author | Editor

Publications (73)

Proceedings Article | 9 March 2020 Presentation

Improved optical cryptosystem based on phase-shifting interferometry in a joint transform correlator

Yi Xiong, Chenggen Quan

Proceedings Volume 11299, 112990I (2020) https://doi.org/10.1117/12.2536528

KEYWORDS: Joint transforms, Binary data, Phase interferometry, Optical correlators, Image encryption, Phase shifts, Information security, Image quality, Modulators, Image storage

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Proceedings Article | 3 September 2019 Presentation + Paper

Correction for aberration introduced by the curvature of the reflective spatial light modulator

A. He, C. Quan

Proceedings Volume 11102, 111020Y (2019) https://doi.org/10.1117/12.2531547

KEYWORDS: Spatial light modulators, Liquid crystal on silicon, Phase retrieval, Wavefronts, Phase modulation, Phase shifting, Liquid crystals

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Proceedings Article | 30 April 2019 Presentation + Paper

Multiuser optical information authentication using photon counting in spiral phase transform domain

Ravi Kumar, Chenggen Quan

Proceedings Volume 11027, 110270D (2019) https://doi.org/10.1117/12.2520844

KEYWORDS: Image encryption, Photon counting, Nonlinear dynamics, Matrices, Fourier transforms, Information security, Image processing, Numerical simulations, Optical image encryption, Symmetric-key encryption

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SPIE Journal Paper | 17 November 2017

Asymmetric optical image encryption using Kolmogorov phase screens and equal modulus decomposition

Ravi Kumar, Basanta Bhaduri, Chenggen Quan

OE, Vol. 56, Issue 11, 113109, (November 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.113109

KEYWORDS: Image encryption, Optical image encryption, Computer security, Turbulence, Image processing, Gyrators, Optical engineering, Modulation, Atmospheric propagation, Spatial light modulators

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SPIE Journal Paper | 22 June 2016

Determination of slope, curvature, and twist from a single shearography fringe pattern using derivative-based regularized phase tracker

Balakrishnan Deepan, Chenggen Quan, Cho Jui Tay

OE, Vol. 55, Issue 12, 121707, (June 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.12.121707

KEYWORDS: Fringe analysis, Shearography, Speckle, Interferometry, Optical engineering, Demodulation, Phase shift keying, Phase measurement, Phase retrieval, Digital holography

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Proceedings Article | 17 July 2015 Paper

Comparison of two methods for short circuit current measurement of large size solar cell

Xuebo Huang, Chenggen Quan, Jerald Kng

Proceedings Volume 9524, 95242A (2015) https://doi.org/10.1117/12.2189647

KEYWORDS: Solar cells, Photodiodes, Calibration, Laser beam diagnostics, Amplifiers, Lamps, Time metrology, Photovoltaics, Modulation, Diodes

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The differential spectral responsivity (DSR) measurement and the solar simulator based current to voltage characterisation methods are two accurate methods for measuring the short circuit current, a critical parameter, of a solar cell under standard testing conditions. For the calibration of World Photovoltaic Scale (WPVS) reference solar cell with small size (20 mm x 20 mm), the measurement results using these two methods are agreed well within 1%. But for the calibration of large size (e.g. 156 mm x 156 mm) of solar cell, the measurement results using two methods are not agreed well and their deviation could be more than 10 %. In DSR method, the short circuit current of a solar cell is determined through measuring its relative irradiance spectral responsivity in spectral range from 280 nm to 1200 nm and its absolute irradiance responsivity at wavelength of 650 nm by reference standard photodiodes. As the detective area of large size solar cell (detective area: 156 mm x 156 mm) is much bigger than that of standard photodiodes (detective area: 12.56 mm²), the spatial uniformity of irradiance of modulated monochromatic probe beam on the test solar cell and the standard photodiode is critical for calculation of absolute irradiance responsivity of the test solar cell. The correction for the calculation must be done according to the measured spatial uniformity of probe beam and the detective areas of the test solar cell and standard photodiodes. The experiment showed the correction factor and its uncertainty are smaller if the detective areas difference between the test solar cell and the standard is smaller. Based on this observation, a standard solar cell (detective area: 20 mm x 20 mm) instead of standard photodiodes was used to calibrate absolute irradiance responsivity of the test solar cell (detective area: 156 mm x 156 mm) at wavelength of 650 nm. After such improvement, measurement results using two different methods agree well about 3 % for the large size solar cell. The details of this comparison will be discussed in the paper.

Proceedings Article | 6 March 2015 Paper

Nonlinear optical security system with a modified amplitude phase retrieval algorithm

Yong Wang, Chenggen Quan, Cho Jui Tay

Proceedings Volume 9302, 93020R (2015) https://doi.org/10.1117/12.2081138

KEYWORDS: Image encryption, Image processing, Phase retrieval, Binary data, Fourier transforms, Image quality, Phase shift keying, Phase modulation, Computer security, Numerical simulations

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Proceedings Article | 4 March 2015 Paper

Phase retrieval from a single fringe pattern using Teager-Hilbert-Huang transform

Deepan Balakrishnan, C. Quan, C. J. Tay

Proceedings Volume 9302, 93020Q (2015) https://doi.org/10.1117/12.2081237

KEYWORDS: Fringe analysis, Phase retrieval, Algorithm development, Interferometry, Phase shifts, Error analysis, Speckle pattern, Demodulation, Fourier transforms, Digital filtering

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Proceedings Article | 2 June 2014 Paper

Compressive sensing for digital holographic interferometry

B. Deepan, C. Quan, C. Tay

Proceedings Volume 9234, 923419 (2014) https://doi.org/10.1117/12.2055054

KEYWORDS: Holograms, Super resolution, Digital holography, Holography, Filtering (signal processing), Compressed sensing, Holographic interferometry, Fourier transforms, Hassium, Reconstruction algorithms

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Proceedings Article | 22 June 2013 Paper

Ensemble of hybrid genetic algorithm for two-dimensional phase unwrapping

D. Balakrishnan, C. Quan, C. J. Tay

Proceedings Volume 8769, 87691N (2013) https://doi.org/10.1117/12.2020382

KEYWORDS: Evolutionary algorithms, Genetic algorithms, Artificial intelligence, Signal to noise ratio, Algorithms, Promethium, Phase retrieval, Particle swarm optimization, Algorithm development, Optimization (mathematics)

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Proceedings Article | 22 June 2013 Paper

Development of a fast and accurate color-encoded digital fringe projection profilometry

Z. Liu, C. Quan, C. J. Tay

Proceedings Volume 8769, 87692E (2013) https://doi.org/10.1117/12.2018756

KEYWORDS: Fourier transforms, Phase shifts, 3D metrology, Fringe analysis, Error analysis, Projection systems, CCD cameras, Imaging systems, Computing systems, Electro optics

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Proceedings Article | 22 June 2013 Paper

Investigation of bias radiation effect on PV cell measurement

Xuebo Huang, Chenggen Quan, Joanne Chan, Patrick Ng

Proceedings Volume 8769, 87690K (2013) https://doi.org/10.1117/12.2021519

KEYWORDS: Lamps, Solar cells, Xenon, Halogens, Light sources, Calibration, Photodiodes, Solar energy, Signal to noise ratio, Laser beam diagnostics

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Proceedings Article | 22 June 2013 Paper

Temperature effect on measurements of spectral responsivity of reference solar cell

Xuebo Huang, Chenggen Quan, Yuanbo Li, Patrick Ng

Proceedings Volume 8769, 87691B (2013) https://doi.org/10.1117/12.2021520

KEYWORDS: Solar cells, Temperature metrology, Photodiodes, Solar energy, Calibration, Resistance, Photovoltaics, Spectral calibration, Metrology, Amplifiers

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Proceedings Article | 15 October 2012 Paper

Micro-profile measurement of a transparent coating using windowed Fourier transform in white-light vertical scanning interferometry

Suodong Ma, Chenggen Quan, Rihong Zhu, Lei Chen

Proceedings Volume 8417, 841725 (2012) https://doi.org/10.1117/12.970532

KEYWORDS: Coating, Microelectromechanical systems, Interferometry, Ferroelectric materials, Fourier transforms, Reflectivity, Optics manufacturing, Electronic filtering, Laser optics, Light sources

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Proceedings Article | 18 May 2012 Paper

Pulsed and high-speed FTIR spectroscopy

Sascha Heussler, Herbert Moser, S. M. P. Kalaiselvi, Chenggen Quan, Cho Jui Tay, Shuvan P. Turaga, Mark Breese

Proceedings Volume 8374, 83740T (2012) https://doi.org/10.1117/12.919533

KEYWORDS: Mirrors, Spectroscopy, FT-IR spectroscopy, Interferometers, Fourier transforms, Sensors, Photomasks, Beam splitters, Manufacturing, Signal to noise ratio

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SPIE Journal Paper | 1 August 2011

Retrieval of complex object fields in coherent diffractive imaging using position shift of a phase mask

Wen Chen, Chenggen Quan, Cho Jui Tay

OE, Vol. 50, Issue 08, 080502, (August 2011) https://doi.org/10.1117/12.10.1117/1.3614472

KEYWORDS: Coherence imaging, Diffraction, Phase retrieval, Algorithm development, Phase shift keying, Charge-coupled devices, Modulation, CCD cameras, Phase shifts, Wavefronts

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Proceedings Article | 14 May 2010 Paper

Motion detection using speckle photography and extended fractional Fourier transform

B. Bhaduri, C. Tay, C. Quan

Proceedings Volume 7718, 771813 (2010) https://doi.org/10.1117/12.853632

KEYWORDS: Speckle, Photography, Fractional fourier transform, Sensors, Fourier transforms, Charge-coupled devices, Motion detection, Motion measurement, Mirrors, Fringe analysis

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Proceedings Article | 14 May 2010 Paper

Phase retrieval in ESPI from a dense phase fringe pattern

H. Niu, C. Quan, C. Tay

Proceedings Volume 7718, 771817 (2010) https://doi.org/10.1117/12.853775

KEYWORDS: Speckle, Fringe analysis, Phase retrieval, Fourier transforms, Phase shifting, Phase shifts, Phase measurement, Denoising, Beam splitters, Ferroelectric materials

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SPIE Journal Paper | 1 April 2010

Stress gradient of a micro-optoelectromechanical systems Fabry−Perot cavity based on InP

Cho Jui Tay, Chenggen Quan, Huicong Liu, M. Gopal, Ramam Akkipeddi

JM3, Vol. 9, Issue 02, 023010, (April 2010) https://doi.org/10.1117/12.10.1117/1.3421968

KEYWORDS: Finite element methods, Interferometry, Indium gallium arsenide, Arsenic, Scanning electron microscopy, Image processing, Ferroelectric materials, Fabry–Perot interferometers, Reflectors, Metalorganic chemical vapor deposition

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Proceedings Article | 4 March 2010 Paper

Radial segmentation approach for contact hole patterning in 193 nm immersion lithography

Moh Lung Ling, Gek Soon Chua, Sia Kim Tan, Cho Jui Tay, Chenggen Quan, Qunying Lin

Proceedings Volume 7640, 76402M (2010) https://doi.org/10.1117/12.848431

KEYWORDS: Optical lithography, Nanoimprint lithography, Image segmentation, Optical proximity correction, Photomasks, Immersion lithography, Image enhancement, Printing, Diffraction, SRAF

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SPIE Journal Paper | 1 March 2010

Direct measurement of curvature and twist using two-channel double-aperture digital shearography

Basanta Bhaduri, Cho Jui Tay, Chenggen Quan

OE, Vol. 49, Issue 03, 033604, (March 2010) https://doi.org/10.1117/12.10.1117/1.3359470

KEYWORDS: Shearography, Speckle, Fourier transforms, Charge-coupled devices, Lenses, Optical engineering, Beam splitters, CCD cameras, Digital holography, Optical filters

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Proceedings Article | 25 August 2009 Paper

Determination of curvature and twist of deformed object by digital holographic interferometry

C. Quan, W. Chen, C. Tay

Proceedings Volume 7375, 73753H (2009) https://doi.org/10.1117/12.839256

KEYWORDS: Digital holography, Fourier transforms, Holographic interferometry, Image filtering, Algorithm development, Holograms, Digital filtering, Beam splitters, Charge-coupled devices, Shearography

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Proceedings Article | 16 March 2009 Paper

Line end shortening and corner rounding for novel off-axis illumination source shapes

Moh Lung Ling, Gek Soon Chua, Qunying Lin, Cho Jui Tay, Chenggen Quan

Proceedings Volume 7274, 72742V (2009) https://doi.org/10.1117/12.814057

KEYWORDS: Optical proximity correction, Diffusion, Image quality, Lithography, Distortion, Critical dimension metrology, Diffraction, Spatial frequencies, Illumination engineering, Lithographic illumination

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Proceedings Article | 3 October 2008 Paper

Phase retrieval in digital holographic interferometry based on complex phasor and short time Fourier transform

Wen Chen, Chenggen Quan, Cho Jui Tay

Proceedings Volume 7155, 71551I (2008) https://doi.org/10.1117/12.814555

KEYWORDS: Digital holography, Holographic interferometry, Fourier transforms, Holograms, Time-frequency analysis, Beam splitters, Phase retrieval, Reconstruction algorithms, CCD cameras, Holography

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Proceedings Article | 3 October 2008 Paper

Temporal Paul wavelet analysis for phase retrieval using shadow moire technique

H. Niu, C. Quan, C. J. Tay

Proceedings Volume 7155, 71552B (2008) https://doi.org/10.1117/12.814585

KEYWORDS: Wavelets, Fourier transforms, Fringe analysis, Wavelet transforms, Phase retrieval, Signal to noise ratio, Denoising, Continuous wavelet transforms, Moire patterns, CCD cameras

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SPIE Journal Paper | 1 June 2008

Retrieval of instantaneous frequency from digital holograms based on adaptive windows

Wen Chen, Chenggen Quan, Cho Jui Tay

OE, Vol. 47, Issue 06, 065801, (June 2008) https://doi.org/10.1117/12.10.1117/1.2939418

KEYWORDS: Digital holography, Holograms, Fourier transforms, Fringe analysis, Time-frequency analysis, Optical engineering, 3D image reconstruction, Digital filtering, Continuous wavelet transforms, Image filtering

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Proceedings Article | 12 March 2008 Paper

Customized illumination shapes for 193nm immersion lithography

Moh Lung Ling, Gek Soon Chua, Qunying Lin, Cho Jui Tay, Chenggen Quan

Proceedings Volume 6924, 692435 (2008) https://doi.org/10.1117/12.772441

KEYWORDS: Critical dimension metrology, Lithographic illumination, Diffraction, Photomasks, Optical lithography, Immersion lithography, Resolution enhancement technologies, Coherence imaging, Phase shifts, Spatial frequencies

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SPIE Journal Paper | 1 March 2008

Dynamic characterization of a microgyroscope by digital image spectrum correlation

W. Sun, Chenggen Quan, Xiaoyuan He

OE, Vol. 47, Issue 03, 033602, (March 2008) https://doi.org/10.1117/12.10.1117/1.2896537

KEYWORDS: Digital image correlation, Gyroscopes, Digital imaging, Continuous wavelet transforms, Optical engineering, Sun, Beam shaping, Motion measurement, Image quality, Microelectromechanical systems

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SPIE Journal Paper | 1 November 2007

Speckle noise reduction in digital holography by multiple holograms

Chenggen Quan, Xin Kang, Cho-Jui Tay

OE, Vol. 46, Issue 11, 115801, (November 2007) https://doi.org/10.1117/12.10.1117/1.2802060

KEYWORDS: Holograms, Speckle, Digital holography, 3D image reconstruction, Speckle pattern, Denoising, CCD image sensors, Optical engineering, Mechanical engineering, Wavefronts

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Proceedings Article | 26 March 2007 Paper

A comparative study for mask defect tolerance on phase and transmission for dry and immersion 193-nm lithography

Moh Lung Ling, Gek Soon Chua, Cho Jui Tay, Chenggen Quan, Qunying Lin

Proceedings Volume 6520, 65203U (2007) https://doi.org/10.1117/12.711629

KEYWORDS: Air contamination, Photomasks, Immersion lithography, Critical dimension metrology, Lithography, Tolerancing, Phase shifts, Lithographic illumination, Imaging systems, Reticles

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Proceedings Article | 26 March 2007 Paper

Process window optimization of CPL mask for beyond 45-nm lithography

Soon Yoeng Tan, Qunying Lin, Cho Jui Tay, Chenggen Quan

Proceedings Volume 6520, 652029 (2007) https://doi.org/10.1117/12.712456

KEYWORDS: Photomasks, Semiconducting wafers, Polarization, Lithography, Printing, Quartz, Etching, Optical lithography, Diffraction, Phase shifts

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Proceedings Article | 20 October 2006 Paper

The study of chromeless phase lithography (CPL) for 45nm lithography

Soon Yoeng Tan, Qunying Lin, Cho Jui Tay, Chenggen Quan

Proceedings Volume 6349, 63492O (2006) https://doi.org/10.1117/12.685887

KEYWORDS: Photomasks, Semiconducting wafers, Lithography, Printing, SRAF, Mask making, Transmittance, Optical proximity correction, Critical dimension metrology, Etching

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SPIE Journal Paper | 1 May 2006

Study on the use of white light interferometry for multifiber-end surface profile measurement

Chenggen Quan, Shihua Wang, Cho Jui Tay, Ivan Reading

OE, Vol. 45, Issue 05, 055603, (May 2006) https://doi.org/10.1117/12.10.1117/1.2205892

KEYWORDS: Reflectivity, Optical interferometry, Connectors, Interferometers, Ferroelectric materials, Interferometry, Optical engineering, Signal to noise ratio, Beam splitters, Visibility

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Proceedings Article | 17 September 2005 Paper

Temporal phase analysis techniques using wavelet transform

C. Quan, Y. Fu, C. Tay

Proceedings Volume 5914, 59140B (2005) https://doi.org/10.1117/12.613224

KEYWORDS: Wavelet transforms, Wavelets, Speckle pattern, Fourier transforms, Image processing, Continuous wavelet transforms, Interferometry, Velocity measurements, Bandpass filters, Digital filtering

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SPIE Journal Paper | 1 August 2005

Shape measurement by the use of digital image correlation

Y. Huang, Chenggen Quan, Cho Jui Tay, Lujie Chen

OE, Vol. 44, Issue 08, 087011, (August 2005) https://doi.org/10.1117/12.10.1117/1.2012202

KEYWORDS: Digital image correlation, Calibration, Speckle, Cameras, Optical engineering, Digital imaging, Imaging systems, Speckle pattern, Coded apertures, Modulation

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Proceedings Article | 12 May 2005 Paper

Polarization impact on partially coherent imaging

Gek Soon Chua, Cho Jui Tay, Chenggen Quan, Qunying Lin

Proceedings Volume 5754, (2005) https://doi.org/10.1117/12.600415

KEYWORDS: Polarization, Photomasks, Lithographic illumination, Phase shifts, Optical lithography, Immersion lithography, Image quality, Coherence (optics), System on a chip, Image acquisition

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SPIE Journal Paper | 1 May 2005 Open Access

Optical micro-shadowgraph-based method for measuring micro-solderball height

Shihua Wang, Chenggen Quan, Cho Jui Tay

OE, Vol. 44, Issue 05, 050506, (May 2005) https://doi.org/10.1117/12.10.1117/1.1906003

KEYWORDS: Semiconducting wafers, Wafer-level optics, Standards development, CCD image sensors, Geometrical optics, Silicon, Image sensors, Atrial fibrillation, Mechanical engineering, Metrology

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