Prof. Dong Li Profile

Prof. Dong Li

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Proceedings Article | 1 November 2023 Paper

Simulation of the influence of electron beam incident parameters on the magnification of electron multiplier tube

Qiang Jiao, Dong Li, Xiaofei Li, Feng Zhou

Proceedings Volume 12917, 129170Z (2023) https://doi.org/10.1117/12.3011124

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Electron multiplier tube can be used in the field of electron beam measurement, which can be used to measure the small current electron beam after amplification. In the measurement, in addition to the internal error of the multiplier tube, different incident electron beams will also affect the magnification of the multiplier tube. In order to analyze the error of different incident electron beam parameters on the electron multiplier tube, this paper uses CST to establish the electron multiplier tube model. After verifying the correctness of the simulation model, the energy, incident angle and radius of the incident electron beam are simulated and analyzed. The simulation results show that The parameters of the incident electron beam mainly affect the first multiplication electrode, including its collection efficiency and the number of secondary electrons generated, and ultimately affect the magnification of the electron multiplier tube.

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