Dr. Pierluigi Debernardi
at Politecnico di Torino
SPIE Involvement:
Author
Publications (29)

Proceedings Article | 13 March 2024 Presentation + Paper
Cristina Rimoldi, Lorenzo Columbo, Alberto Tibaldi, Pierluigi Debernardi, Mariangela Gioannini
Proceedings Volume 12904, 129040L (2024) https://doi.org/10.1117/12.3003714
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Relative intensity noise, Modulation, Data communications, Simulations, Data transmission

Proceedings Article | 13 March 2024 Presentation + Paper
N. Ledentsov, V. Shchukin, Ł. Chorchos, O. Yu. Makarov, J.-R. Kropp, I. Titkov, V. Kalosha, V. Zerova, M. Lindemann, N. Gerhardt, M. D’Alessandro, V. Torrelli, P. Debernardi, A. Tibaldi, M. Hofmann
Proceedings Volume 12904, 1290405 (2024) https://doi.org/10.1117/12.3001177
KEYWORDS: Vertical cavity surface emitting lasers, Modulation, Modulation frequency, Laser frequency, Frequency response, Streak cameras, Oscilloscopes, Near field, Single mode fibers, Data acquisition

SPIE Journal Paper | 13 July 2023 Open Access
Qingyue Li, Vincent Raimbault, Pierre-François Calmon, Benjamin Reig, Pierluigi Debernardi, Heidi Ottevaere, Jean-Baptiste Doucet, Julien Roul, Véronique Bardinal
JOM, Vol. 3, Issue 03, 033501, (July 2023) https://doi.org/10.1117/12.10.1117/1.JOM.3.3.033501
KEYWORDS: Vertical cavity surface emitting lasers, Fabrication, Microlens, Design and modelling, Beam divergence, Two photon polymerization, Printing, Optical microsystems, 3D printing, Polymers

Proceedings Article | 5 March 2021 Presentation + Paper
Proceedings Volume 11704, 117040T (2021) https://doi.org/10.1117/12.2577488
KEYWORDS: Polarization, Vertical cavity surface emitting lasers, Modulation, Birefringence, Data communications, Temperature metrology, Data centers

Proceedings Article | 1 April 2020 Presentation + Paper
Proceedings Volume 11356, 113560L (2020) https://doi.org/10.1117/12.2554703
KEYWORDS: Vertical cavity surface emitting lasers, Birefringence, Polarization, Etching, 3D modeling, Photonics, Atomic force microscopy, Semiconducting wafers, Reactive ion etching, Data transmission

Showing 5 of 29 publications
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