PROCEEDINGS VOLUME 2348
PHOTONICS FOR INDUSTRIAL APPLICATIONS | 31 OCTOBER - 4 NOVEMBER 1994
Imaging and Illumination for Metrology and Inspection
Editor(s): Donald J. Svetkoff
Editor Affiliations +
PHOTONICS FOR INDUSTRIAL APPLICATIONS
31 October - 4 November 1994
Boston, MA, United States
Illumination and Viewing Methods and Technology
Etienne Tisserand, Serge Weber, Martial Grimm, Jean-Philippe Igersheim, Gerard Prieur
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198831
Jyrki Laitinen
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198842
Shin-Yee Lu, Michael Graser
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198850
Scott Christian Cahall, Bernard R. Gilbert, Joel H. Blatt
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198853
Donald J. Svetkoff, Donald B.T. Kilgus, David P. Berrich
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198854
Norman Wittels, Michael A. Gennert
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198855
Illumination, Sensor, and Image Modeling and Analysis
Lawrence B. Wolff, Joel Fan
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198856
Ian R. Greenshields, Junchul Chun
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198857
Norman Wittels, Tahar El-Korchi, Yinhong Li, Michael A. Gennert
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198832
Harold Lipshitz, Richard Stillwell, Erol Sancaktar
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198833
Norman R. Guivens Jr.
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198834
Donald B.T. Kilgus, Donald J. Svetkoff
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198835
Paul K. Gallagher
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198836
MingChin Lu, Murali Subbarao
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198837
3D Sensing Methods and Systems I: Interferometry and Fringe Analysis
Robert C. Chang, Christopher W. Carroll
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198838
Leonard H. Bieman, Mark A. Michniewicz
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198839
Rafael A. Andrade, Bernard R. Gilbert, Scott Christian Cahall, Samuel Peter Kozaitis, Joel H. Blatt
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198840
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198841
3D Sensing Methods and Systems II: Structured Light, Laser Radar and Three Dimensional Scanning Systems
Bradley G. Boone, Lane De Nicola, Barry E. Grabow
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198843
Jose A. Ferrari, Erna M. Frins, Arturo Lezama, Ramon Cote, German Da Costa
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198844
Steven J. Gordon, Faycal Benayad-Cherif
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198845
Jacques Lewandowski, Lyne Desjardins
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198846
John Schneiter, Nelson R. Corby Jr., Meng-Ling Haiao, Carl Murray Penney
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198847
Heinrich A. Hoefler, Gerhard Schmidtke, Volker Jetter, A. Henninger
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198848
Richard L. Sebastian, Robert B. Clark, Dana L. Simonson, Anthony R. Slotwinski
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198849
Guanghua Zhang, Jim Clark, Andrew M. Wallace
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198851
3D Sensing Methods and Systems I: Interferometry and Fringe Analysis
Denise M. Lyons
Proceedings Volume Imaging and Illumination for Metrology and Inspection, (1994) https://doi.org/10.1117/12.198852
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